X-ray diffractometer

X-ray diffraction is a powerful, non-destructive technique that is often used for phase identification, determination of crystal structure, measurement of lattice parameters, and evaluation of crystallite size and strain. The system operates with a Cu-Kα radiation source (λ = 1.5406 Å). The sample holder, source and detector configurations enable advanced measurements such as grazing incidence XRD, 2theta-omega scans, and rocking curve (omega) scans.