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The M-2000 Series Spectroscopic Ellipsometer is a modular instrument utilizing groundbreaking rotating compensator (RCE) technology for high accuracy and CCD detection for unmatched measurement speed. This series is widely used for characterization of thin films, their optical properties and thickness.
The M-2000 Series Spectroscopic Ellipsometer is a modular instrument utilizing groundbreaking rotating compensator (RCE) technology for high accuracy and CCD detection for unmatched measurement speed. This series is widely used for characterization of thin films, their optical properties and thickness.